Published August 1984
| Version v1
Journal article
A contribution to X-ray fluorescence analysis of the lanthanoides
Creators
- 1. Frankfurt Univ. (Germany, F.R.). Inst. fuer Anorganische Chemie
Description
A thin-layer method of X-ray fluorescence analysis has been developed for determining the lanthanoides (except Pm) in the presence of each other with Sr as internal standard. Samples are prepared from solutions on filter paper. With suitable L-radiations, linear calibration curves are obtained up to saturated solutions. Matrix effects are eliminated, reflection overlap is corrected efficiently. Statistical detection limits are between 0.2 and 0.6 μg/cm2, i.e. between 20 and 60 ppm in solution. (orig.)
Abstract (German)
Zur Bestimmung aller Lanthanoiden (ausser Pm) nebeneinander mit Sr als innerem Standard wurde eine RFA-Duennschichtmethode entwickelt, bei der die Proben aus Loesungen auf Filterpapier hergestellt werden. Fuer geeignete L-Strahlungen sind die Eichkurven bis zu gesaettigten Loesungen linear. Matrixeffekte werden eliminiert, Reflexueberlagerungen lassen sich wirksam korrigieren. Die statistischen Nachweisgrenzen betragen zwischen 0,2 und 0,6 μg/cm2, d.h. bezogen auf die Loesung zwischen 20 und 60 ppm. (orig.)Additional details
Additional titles
- Original title (German)
- Zur Bestimmung der Lanthanoiden durch Roentgenfluorescenzanalyse
Publishing Information
- Journal Title
- Fresenius' Z. Anal. Chem.
- Journal Volume
- 318
- Journal Issue
- 8
- Series
- CODEN: ZACFA.;Fresenius' Z. Anal. Chem.
- Journal Page Range
- 604-607
- ISSN
- 0016-1152
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 16009341
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- CALIBRATION STANDARDS; CORRELATIONS; DIAGRAMS; MULTI-ELEMENT ANALYSIS; RARE EARTHS; SAMPLE PREPARATION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; ELEMENTS; INFORMATION; METALS; NONDESTRUCTIVE ANALYSIS; X-RAY EMISSION ANALYSIS