Published July 2006
| Version v1
Journal article
Comparison of ghosting effects for three commercial a-Si EPIDs
Creators
- 1. Department of Radiation Oncology, Netherlands Cancer Institute-Antoni van Leeuwenhoek Hospital, Amsterdam (Netherlands)
- 2. Joint Department of Physics, Royal Marsden NHS Foundation Trust/Institute of Cancer Research, Sutton, Surry (United Kingdom)
- 3. Department of Radiation Oncology (MAASTRO PHYSICS), GROW, Maastricht University Hospital, Maastricht (Netherlands)
Description
Many studies have reported dosimetric characteristics of amorphous silicon electronic portal imaging devices (EPIDs). Some studies ascribed a non-linear signal to gain ghosting and image lag. Other reports, however, state the effect is negligible. This study compares the signal-to-monitor unit (MU) ratio for three different brands of EPID systems. The signal was measured for a wide range of monitor units (5-1000), dose-rates, and beam energies. All EPIDs exhibited a relative under-response for beams of few MUs; giving 4 to 10% lower signal-to-MU ratios relative to that of 1000 MUs. This under-response is consistent with ghosting effects due to charge trapping
Additional details
Identifiers
- DOI
- 10.1118/1.2207318;
Publishing Information
- Journal Title
- Medical Physics
- Journal Volume
- 33
- Journal Issue
- 7
- Journal Page Range
- p. 2448-2451
- ISSN
- 0094-2405
- CODEN
- MPHYA6
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38026209
- Subject category
- S62: RADIOLOGY AND NUCLEAR MEDICINE;
- Descriptors DEI
- BEAMS; DOSE RATES; DOSIMETRY; IMAGE PROCESSING; IMAGES; RADIOTHERAPY; SEMICONDUCTOR MATERIALS; SIGNALS; SILICON
- Descriptors DEC
- ELEMENTS; MATERIALS; MEDICINE; NUCLEAR MEDICINE; PROCESSING; RADIOLOGY; SEMIMETALS; THERAPY
Optional Information
- Notes
- (c) 2006 American Association of Physicists in Medicine