Published November 15, 2004
| Version v1
Journal article
Preparation and pattern recognition of O'-sialon by reduction-nitridation from coal gangue
Creators
- 1. Henan Key Laboratories of High Temperature Ceramics, Zhengzhou University, Zhengzhou 450052, Henan Province (China)
Description
The phase composition and microstructure of O'-sialon prepared from Chinese coal gangue have been studied. The use of Si powder is more effective than that of activated carbon or mainly carbon with a little silicon for reduction-nitridation. For specimens with 40% Si addition, more than 80% of O'-sialon may be obtained when nitrided at 1500 degree sign C. The formed O'-sialon was characterized by X-ray diffraction (XRD) and scanning electron microscope (SEM). The parameters for O'-Sialon preparation are optimized by computer pattern recognition program based on principal component analysis, the target parameter optimum regions with higher relative content of O'-Sialon was indicated by this way
Additional details
Identifiers
- DOI
- 10.1016/j.msea.2004.06.052;
- PII
- S0921-5093(04)00878-0;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 385
- Journal Issue
- 1-2
- Journal Page Range
- p. 325-331
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38054017
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACTIVATED CARBON; ALUMINIUM OXIDES; COAL; GANGUE; MICROSTRUCTURE; NITRIDATION; PATTERN RECOGNITION; POWDERS; REDUCTION; SCANNING ELECTRON MICROSCOPY; SILICON; SILICON NITRIDES; X-RAY DIFFRACTION
- Descriptors DEC
- ADSORBENTS; ALUMINIUM COMPOUNDS; CARBON; CARBONACEOUS MATERIALS; CHALCOGENIDES; CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; ENERGY SOURCES; FOSSIL FUELS; FUELS; MATERIALS; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PNICTIDES; RESIDUES; SCATTERING; SEMIMETALS; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.