Turbostratic-like carbon nitride coatings deposited by industrial-scale direct current magnetron sputtering
Creators
- 1. Interdisciplinary Nanoscience Center (iNANO), Department of Physics and Astronomy, Aarhus University, Ny Munkegade 120, Bldg. 1520, DK-8000 Aarhus C (Denmark)
- 2. Tribology Centre, Danish Technological Institute, Teknologiparken, Kongsvang Allé 29, DK-8000 Aarhus C (Denmark)
Description
Carbon nitride thin films were deposited by direct current magnetron sputtering in an industrial-scale equipment at different deposition temperatures and substrate bias voltages. The films had N/(N + C) atomic fractions between 0.2 and 0.3 as determined by X-ray photoelectron spectroscopy (XPS). Raman spectroscopy provided insight into the ordering and extension of the graphite-like clusters, whereas nanoindentation revealed information on the mechanical properties of the films. The internal compressive film stress was evaluated from the substrate bending method. At low deposition temperatures the films were amorphous, whereas the film deposited at approximately 380 °C had a turbostratic-like structure as confirmed by high-resolution transmission electron microscopy images. The turbostratic-like film had a highly elastic response when subjected to nanoindentation. When a CrN interlayer was deposited between the film and the substrate, XPS and Raman spectroscopy indicated that the turbostratic-like structure was maintained. However, it was inconclusive whether the film still exhibited an extraordinary elastic recovery. An increased substrate bias voltage, without additional heating and without deposition of an interlayer, resulted in a structural ordering, although not to the extent of a turbostratic-like structure. - Highlights: • Carbon nitride films were deposited by industrial-scale magnetron sputtering. • The deposition temperature and the substrate bias voltage were varied. • A turbostratic-like structure was obtained at an elevated deposition temperature. • The turbostratic-like film exhibited a very high elastic recovery. • The influence of a CrN interlayer on the film properties was investigated
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2013.03.016Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2013.03.016;
- PII
- S0040-6090(13)00447-1;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 536
- Journal Page Range
- p. 25-31
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46084735
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CARBON NITRIDES; DEPOSITION; DEPOSITS; DIRECT CURRENT; GRAPHITE; MAGNETRONS; MECHANICAL PROPERTIES; RAMAN SPECTROSCOPY; SPUTTERING; STRESSES; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CARBON; CARBON COMPOUNDS; CURRENTS; ELECTRIC CURRENTS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; LASER SPECTROSCOPY; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; MINERALS; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; PHOTOELECTRON SPECTROSCOPY; PNICTIDES; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.