Published November 2004 | Version v1
Journal article Metadata-only

Multiplication effect of the secondary emission microwave electron gun

Creators

  • 1. China Science and Technology Univ., Hefei (China). National Synchrotron Radiation Laboratory

Description

Using the primary program 3DRun given by code VC++, multiplication effect of secondary emission microwave electron gun (SEMEG) is investigated. The relation between multiplication effect and length of cavity as well as electric field in the gun is studied with one-dimension simulation. The Longitudinal bunching and energy focusing of out electrons is calculated in detail at 10 mm length of cavity and 5.4 MV/m electric field in the gun. The beam dynamics with space charge effect is also investigated with 3DRun. The emittance of out beam is calculated. With simulation and analysis, it is proved that SEMEG can provide high-current, low-emittance electron pulse. (authors)

Additional details

Publishing Information

Journal Title
High Power Laser and Particle Beams
Journal Volume
16
Journal Issue
11
Journal Page Range
p. 1477-1480
ISSN
1001-4322

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
37041045
Subject category
S43: PARTICLE ACCELERATORS;
Descriptors DEI
BEAM EMITTANCE; CAVITY RESONATORS; ELECTRIC FIELDS; ELECTRON GUNS; FOCUSING; LENGTH; NUMBER CODES; SECONDARY EMISSION; SIMULATION; SPACE CHARGE
Descriptors DEC
COMPUTER CODES; DIMENSIONS; ELECTRONIC EQUIPMENT; EMISSION; EQUIPMENT; RESONATORS

Optional Information

Notes
6 figs., 7 refs.