Published December 2014 | Version v1
Journal article

Stability of nanoclusters in 14YWT oxide dispersion strengthened steel under heavy ion-irradiation by atom probe tomography

  • 1. Department of Engineering Physics, University of Wisconsin–Madison, Madison, WI 53706 (United States)
  • 2. School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083 (China)
  • 3. Idaho National Laboratory, Idaho Falls, ID (United States)
  • 4. Pacific Northwest National Laboratory, Richland, WA (United States)
  • 5. Center for Advanced Energy Studies, Idaho Falls, ID (United States)
  • 6. Department of Materials Science and Engineering, Boise State University, Boise, ID (United States)

Description

14YWT oxide dispersion strengthened (ODS) ferritic steel was irradiated with of 5 MeV Ni2+ ions, at 300 °C, 450 °C, and 600 °C to a damage level of 100 dpa. The stability of Ti–Y–O nanoclusters was investigated by applying atom probe tomography (APT) in voltage mode, of the samples before and after irradiations. The average size and number density of the nanoclusters was determined using the maximum separation method. These techniques allowed for the imaging of nanoclusters to sizes well below the resolution limit of conventional transmission electron microscopy techniques. The most significant changes were observed for samples irradiated at 300 °C where the size (average Guinier radius) and number density of nanoclusters were observed to decrease from 1.1 nm to 0.8 nm and 12 × 1023 to 3.6 × 1023, respectively. In this study, the nanoclusters are more stable at higher temperature

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jnucmat.2014.03.024

Additional details

Identifiers

DOI
10.1016/j.jnucmat.2014.03.024;
PII
S0022-3115(14)00133-0;

Publishing Information

Journal Title
Journal of Nuclear Materials
Journal Volume
455
Journal Issue
1-3
Journal Page Range
p. 41-45
ISSN
0022-3115
CODEN
JNUMAM

Conference

Title
16. international conference on fusion reactor materials
Acronym
ICFM-16
Dates
20-26 Oct 2013
Place
Beijing (China)

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.