Scanning-probe-microscopy of polyethylene terephthalate surface treatment by argon ion beam

Highlights: • Kelvin-probe-force microscopy helps study of PET surface treated by Ar ion beam. • Ar ion beam surface treatment promotes chain scission and N insertion. • Surface roughness and work function increases as intensity of ion energy increases. • Adhesive force of PET decrease due to the surface changes by ion bombardment. - Abstract: The effect of argon (Ar⁺) ion beam treatment on the surface of polyethylene terephthalate (PET) samples was studied by scanning probe microscopy (SPM) and the changes in surface topography were assessed by atomic force microscopy (AFM). Kelvin probe force microscopy (KPFM) sheds light of adhesion force between treated polymer films and a Pt/Cr probe under dry conditions, obtaining the contact potential difference of material. As a result of Ar⁺ ion bombardment, important surface chemical changes were detected by X-ray photoelectron spectroscopy (XPS) measurements such as chains scission and incorporation of nitrogen species. Ion beam treatment increases the surface roughness from 0.49 ± 0.1 nm to 7.2 ± 0.1 nm and modify the surface potential of PET samples, decreasing the adhesive forces from 12.041 ± 2.1 nN to 5.782 ± 0.06 nN, and producing a slight increase in the electronic work function (Φ_e) from 5.1 V (untreated) to 5.2 V (treated). Ar⁺ ion beam treatment allows to potentially changing the surface properties of PET, modifying surface adhesion, improving surface chemical changes, wetting properties and surface potential of polymers.