Published October 30, 2012
| Version v1
Journal article
Abrupt changes in neon discharge plasma detected via the optogalvanic effect
- 1. Dept. of Physics and Astronomy, Butler University, Indianapolis, IN 46208 (United States)
- 2. Dept. of Physics and Astronomy, Howard University, Washington DC 20059 (United States)
- 3. Dept. of Physical Science, Belfry School, Belfry, KY 41514 (United States)
Description
When a laser is tuned between two excited energy levels of a gas in a Direct Current discharge lamp, the discharge current will experience a temporary disturbance lasting tens or hundreds of microseconds known as the optogalvanic effect. We have carried out extensive studies of optogalvanic effects in neon discharge plasmas for transitions at 621.7 nm, 630.5 nm, 638.3 nm, 650.7 nm and 659.9 nm. A nonlinear least-squares Monte Carlo technique has been used to determine the relevant amplitude coefficients, decay rates and the instrumental time constant. We discovered an abrupt change in the neon discharge plasma at a discharge current of about 6 mA.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2011.12.088Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2011.12.088;
- PII
- S0040-6090(12)00019-3;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 521
- Journal Page Range
- p. 155-157
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 3. international conference on microelectronics and plasma technology
- Acronym
- ICMAP2011
- Dates
- 4-7 Jul 2011
- Place
- Dalian (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44103663
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS; S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DIRECT CURRENT; ENERGY LEVELS; MONTE CARLO METHOD; NEON; PLASMA DIAGNOSTICS
- Descriptors DEC
- CALCULATION METHODS; CURRENTS; ELECTRIC CURRENTS; ELEMENTS; FLUIDS; GASES; NONMETALS; RARE GASES
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.