Published October 30, 2012 | Version v1
Journal article

Abrupt changes in neon discharge plasma detected via the optogalvanic effect

  • 1. Dept. of Physics and Astronomy, Butler University, Indianapolis, IN 46208 (United States)
  • 2. Dept. of Physics and Astronomy, Howard University, Washington DC 20059 (United States)
  • 3. Dept. of Physical Science, Belfry School, Belfry, KY 41514 (United States)

Description

When a laser is tuned between two excited energy levels of a gas in a Direct Current discharge lamp, the discharge current will experience a temporary disturbance lasting tens or hundreds of microseconds known as the optogalvanic effect. We have carried out extensive studies of optogalvanic effects in neon discharge plasmas for transitions at 621.7 nm, 630.5 nm, 638.3 nm, 650.7 nm and 659.9 nm. A nonlinear least-squares Monte Carlo technique has been used to determine the relevant amplitude coefficients, decay rates and the instrumental time constant. We discovered an abrupt change in the neon discharge plasma at a discharge current of about 6 mA.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2011.12.088

Additional details

Identifiers

DOI
10.1016/j.tsf.2011.12.088;
PII
S0040-6090(12)00019-3;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
521
Journal Page Range
p. 155-157
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
3. international conference on microelectronics and plasma technology
Acronym
ICMAP2011
Dates
4-7 Jul 2011
Place
Dalian (China)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44103663
Subject category
S73: NUCLEAR PHYSICS AND RADIATION PHYSICS; S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DIRECT CURRENT; ENERGY LEVELS; MONTE CARLO METHOD; NEON; PLASMA DIAGNOSTICS
Descriptors DEC
CALCULATION METHODS; CURRENTS; ELECTRIC CURRENTS; ELEMENTS; FLUIDS; GASES; NONMETALS; RARE GASES

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.