Position reconstruction in two-dimensional position-sensitive silicon detectors: a new analytical method

A new analytical method for position reconstruction in continuous two-dimensional position-sensitive silicon detectors is presented. By means of a simple ansatz about the resistive charge division, we find a relation which links the x and y-coordinates to the four position signals collected at the corners of the resistive layer. A constrained-fit technique allows this relation to be inverted analytically. The method is applied to both point-like and L-shaped electrodes. The resolution associated with this method is shown for a typical data sample. ((orig.))