Published March 2001 | Version v1
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New capabilities in spectroscopy on pulsed sources: adjustable pulse repetition rate, resolution and line shape

  • 1. Los Alamos National Laboratory, Los Alamos, NM (United States)

Description

Spectroscopy with cold neutrons is one of the most important areas of current superiority of reactor based instruments over those at spallation sources. This is particularly due to the capability of continuous source time-of-flight spectrometers to use instrumental parameters optimally adapted for best data collection rate in each experiment. These parameters include the pulse repetition rate and the length of the pulses to achieve optimal balance between resolution and intensity. In addition, the disc chopper systems used provide perfect symmetrical line shapes with no tails and low background. We present a set of novel techniques making up the IN500 project at Los Alamos, which is based on the combined use of extended pulse length, coupled moderator, disc chopper system and advanced neutron optical beam delivery. This development will enable Lujan center to surpass the best reactor sources in cold neutron spectroscopy by realizing for the first time all of the above key capabilities of steady state instruments on a pulsed spallation source. (author)

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Part of:
Proceedings of the fifteenth meeting of the international collaboration on advanced neutron sources (ICANS-XV). Advanced neutron sources towards the next century

Additional details

Publishing Information

Imprint Title
Proceedings of the fifteenth meeting of the international collaboration on advanced neutron sources (ICANS-XV). Advanced neutron sources towards the next century
Imprint Pagination
1451 p.
Journal Page Range
v. 1 p. 349-353
Report number
JAERI-Conf--2001-002

Conference

Title
15. meeting of the international collaboration on advanced neutron sources
Acronym
ICANS-XV
Dates
6-9 Nov 2000
Place
Tsukuba, Ibaraki (Japan)

Optional Information

Notes
3 refs., 4 figs. Imprint:Published in 2 volumes
Secondary number(s)
KEK-PROC--2000-22