Published October 1981
| Version v1
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Analysis by SIMS and AES of H:TiO2 electrodes
- 1. Instituto Politecnico Nacional, Mexico City. Centro de Investigacion y de Estudios Avanzados
Description
TiO2 electrodes produced by heating in H2 atmosphere have been analysed. SIMS (Secondary Ion Mass Spectroscopy) and AES (Auger Electron Spectroscopy) techniques were used in order to identify the atomic composition in the electrodes surface. (A.R.H.)
Abstract (Portuguese)
Analisam-se eletrodos de TiO2, preparados por aquecimento em uma atmosfera de H2. Utilizam-se tecnicas SIMS (Secondary Ion Mass Spectroscopy) e AES (Auger Electron Spectroscopy) para identificar a composicao atomica da superficie dos eletrodos. (A.R.H.)Files
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Additional details
Additional titles
- Original title (Spanish)
- Analisis SIMS y AES de electrodes H:TiO
Publishing Information
- Imprint Title
- Proceedings of the 1. Latin-American Colloquium of Surface Physics
- Imprint Pagination
- 249 p.
- Journal Page Range
- p. 141-143.
- Report number
- INIS-BR--79
Conference
- Title
- 1. Latin-American Colloquium of Surface Physics.
- Dates
- 1-5 Dec 1980.
- Place
- Niteroi, RJ (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 14785938
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARBON; ELECTROCHEMISTRY; ELECTRODES; QUANTITATIVE CHEMICAL ANALYSIS; QUANTITY RATIO; TEMPERATURE DEPENDENCE; TITANIUM OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; ELEMENTS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- Imprint:Anais do 1. Coloquio Latino-Americano de Fisica de Superficies.