Published September 1, 1973 | Version v1
Journal article

Thin film detector response to the passage of accelerated heavy ions

  • 1. Florida Univ., Gainesville (USA). Dept. of Chemistry
  • 2. Oak Ridge National Lab., Tenn. (USA)
  • 3. Oak Ridge Technical Enterprises, Tenn. (USA)

Description

no abstract available

Additional details

Identifiers

Publishing Information

Journal Title
Nuclear Instruments and Methods
Journal Volume
111
Journal Issue
3
Series
Nucl. Instrum. Methods.
Journal Page Range
581-585
ISSN
0029-554X

Optional Information

Notes
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