Published September 1, 1973
| Version v1
Journal article
Thin film detector response to the passage of accelerated heavy ions
- 1. Florida Univ., Gainesville (USA). Dept. of Chemistry
- 2. Oak Ridge National Lab., Tenn. (USA)
- 3. Oak Ridge Technical Enterprises, Tenn. (USA)
Description
no abstract available
Additional details
Identifiers
Publishing Information
- Journal Title
- Nuclear Instruments and Methods
- Journal Volume
- 111
- Journal Issue
- 3
- Series
- Nucl. Instrum. Methods.
- Journal Page Range
- 581-585
- ISSN
- 0029-554X
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 5102345
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ATOMIC NUMBER; ENERGY DEPENDENCE; ENERGY LOSSES; ENERGY RESOLUTION; FILMS; HEAVY IONS; ION BEAMS; PULSES; SCINTILLATION COUNTERS; SENSITIVITY; TIME-OF-FLIGHT METHOD; VELOCITY
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; IONS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RESOLUTION
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent