Published October 2003 | Version v1
Journal article

Finite element analysis of nanostructures with roughness and scratches

Description

Finite element analysis facilitates optimal design of MEMS/NEMS devices for reliability. A finite element method (FEM) was developed to analyze the effect of types of surface roughness and scratches on stresses of nanostructures. Beams with surface roughness in the form of semicircular and grooved asperities in varying numbers in the longitudinal direction were considered. In the transverse direction semicircular asperities and scratches in varying numbers and with different pitch were modeled. Furthermore semicircular asperities were truncated both in longitudinal and transverse direction and analyzed. It was observed that the asperities and scratches increase the bending tensile stresses which could lead to failure of MEMS/NEMS devices. The beam material was assumed to be purely elastic, elastic-plastic and elastic-perfectly plastic to observe the variations in the bending stresses and displacements for both smooth nanobeam and nanobeam with defined roughness. The results of the analysis can be useful to designers to develop the most suitable geometry for nanostructures

Additional details

Identifiers

DOI
10.1016/S0304-3991;
PII
S0304399103000780;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
97
Journal Issue
1-4
Journal Page Range
p. 495-507
ISSN
0304-3991
CODEN
ULTRD6

Conference

Title
4. international conference on scanning probe microscopy, sensors and nanostructures
Dates
26-29 May 2002
Place
Las Vegas, NV (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37039660
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMIC FORCE MICROSCOPY; BEAMS; BENDING; DESIGN; ELECTROMECHANICS; FINITE ELEMENT METHOD; GEOMETRY; MICROSTRUCTURE; NANOSTRUCTURES; PLASTICS; RELIABILITY; SILICON; STRESSES; SURFACES; VARIATIONS
Descriptors DEC
CALCULATION METHODS; DEFORMATION; ELEMENTS; MATERIALS; MATHEMATICAL SOLUTIONS; MATHEMATICS; MECHANICS; MICROSCOPY; NUMERICAL SOLUTION; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PETROCHEMICALS; PETROLEUM PRODUCTS; POLYMERS; SEMIMETALS; SYNTHETIC MATERIALS

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.