Characterization of ion emission of an extreme ultraviolet generating discharge produced Sn plasma
Creators
- 1. Eindhoven University of Technology, Den Dolech 2, 5600 MB Eindhoven (Netherlands)
- 2. ISAN Institute of Spectroscopy, Fizicheskaya Str. 5, Troitsk, Moscow Region 142190 (Russian Federation)
- 3. ASML, De Run 6501, 5504 DR Veldhoven (Netherlands)
- 4. Philips Research, High Tech Campus 4, 5656 AE Eindhoven (Netherlands)
Description
The ion emission of a Sn-based discharge produced extreme ultraviolet producing plasma is characterized with the combined use of different time-of-flight techniques. An electrostatic ion spectrometer is employed to measure the average charge distribution of the emitted Sn ions. A dedicated Faraday cup configuration is used to measure the total ion flux from the source for different discharge energies. High-energy Sn ions emitted by the plasma with energies up to 100 keV have been identified. The number of high-energy ions increases for higher electrical input energy into the plasma while the signal associated with the expanding plasma ions does not show such dependence. The ion energy distribution for a bulk of detected ions is calculated based on the Faraday cup measurements and compared with theoretical plasma expansion dynamics.
Additional details
Identifiers
- DOI
- 10.1063/1.3268462;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 107
- Journal Issue
- 1
- Journal Page Range
- p. 013301-013301.7
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42072360
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- CHARGE DISTRIBUTION; ELECTRIC DISCHARGES; ENERGY SPECTRA; EXTREME ULTRAVIOLET RADIATION; FARADAY CUPS; ION EMISSION; KEV RANGE; PLASMA; PLASMA DIAGNOSTICS; PLASMA EXPANSION; TIME-OF-FLIGHT METHOD; TIN; TIN IONS
- Descriptors DEC
- BEAM MONITORS; CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; ENERGY RANGE; EXPANSION; IONS; MEASURING INSTRUMENTS; METALS; MONITORS; RADIATIONS; SPECTRA; ULTRAVIOLET RADIATION
Optional Information
- Notes
- (c) 2010 American Institute of Physics