Effect of blind attenuation of a potential of electroradiographic plates on radiographic sensitivity

The effect of blind attenuation of a potential (BAP) on radiographic sensitivity during a long time exposure is determined experimentally and by means of analysis of electroradiographic plate potential attenuation kinetics. Deterioration of radiographic sensitivity due to BAP practically does not affect the testing quality. For the majority of the plates the effect of increase in defect number due to irregularity of BAP distribution over the area is also insignificant. Consequently, PEhR2-3-P, PEhR2-4-P and PEhR4-3-P plates, the relative BAP of which does not exceed 7.12 and 4 % respectively, can be successfully used in defectoscopy with the exposure time up to 30 min. Noticeable effect on radiographic sensitivity of certain plates is produced by the increase in relative BAP due to fatigue. The work should be performed using two plates to reduce fatigue phenomena