Development of a transition-edge sensor bilayer process providing new modalities for critical temperature control
Creators
- 1. Quantum Electromagnetics Division, National Institute of Standards and Technology, Boulder, CO 80305 (United States)
Description
Transition-edge sensors (TESs) are thermal detectors in which a superconducting film that is electrically biased in the superconducting-to-normal transition is used as a thermometer. In most TESs, the film is a superconductor-normal metal bilayer where the two materials and their thicknesses are chosen to achieve various specifications including the transition temperature Tc. Traditionally, the materials in the bilayer are deposited in sequence without breaking vacuum in order to achieve a clean, uniform bilayer interface at the wafer-scale. This approach leads to constraints in material properties, fabrication techniques and, ultimately, TES designs. To overcome these constraints, we have developed a bilayer fabrication process that allows the layers to be deposited and patterned separately with an exposure to atmosphere between the deposition steps. We demonstrate better than 6% transition-temperature uniformity across a 7.6 cm (3 in) substrate and present satisfactory spectra from TES x-ray detectors fabricated in this fashion. We show how the new hybrid additive-subtractive TES fabrication process creates new design possibilities, including broad tuning of Tc across a substrate with a single bilayer thickness. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6668/abb206Additional details
Identifiers
Publishing Information
- Journal Title
- Superconductor Science and Technology
- Journal Volume
- 33
- Journal Issue
- 11
- Journal Page Range
- [10 p.]
- ISSN
- 0953-2048
- CODEN
- SUSTEF
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52057625
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRITICAL TEMPERATURE; DEPOSITION; DEPOSITS; FABRICATION; INTERFACES; LAYERS; LIMITING VALUES; SENSORS; SPECTRA; SUBSTRATES; SUPERCONDUCTING FILMS; SUPERCONDUCTORS; TEMPERATURE CONTROL; THERMOMETERS; THICKNESS; X RADIATION
- Descriptors DEC
- CONTROL; DIMENSIONS; ELECTROMAGNETIC RADIATION; FILMS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; RADIATIONS; THERMODYNAMIC PROPERTIES; TRANSITION TEMPERATURE