Published December 2003 | Version v1
Journal article

Track etch rates along the trajectories of nitrogen and oxygen ions in CR-39

Description

Experimental studies on track etch rates in CR-39 performed with protons, deuterons and alpha particles as well as 7Li, 11B and 12C ions were extended to 14N and 16O ions. The results are compatible with the general systematics found for the dependence on the kind of ion and its initial energy. Analysing the etch rate ratios as function of the restricted energy loss (REL), the non-existence of a unique relationship has been confirmed. However, assuming a dependence of the etch rate ratio not only on REL, but also on the depth within the detector where a given REL value occurs, all experimental data could be adjusted. The experiments with 14N and 16O ions allow extension of the REL range studied up to about 14 000 MeV/cm. The whole area relevant to neutron-induced charged particles generated within the CR-39 detectors is covered thereby. Having added the data for 14N and 16O ions, the array of curves for the etch rate ratio could be expanded up to 14 000 MeV/cm without inconsistencies, demonstrating the compatibility of the new data set also quantitatively

Additional details

Identifiers

DOI
10.1016/S1350-4487(03)00046-5;
arXiv
arXiv:hep-th/9811205v2;
PII
S1350448703000465;

Publishing Information

Journal Title
Radiation Measurements
Journal Volume
37
Journal Issue
6
Journal Page Range
p. 583-587
ISSN
1350-4487
CODEN
RMEAEP

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.