Published February 26, 2007 | Version v1
Journal article

High-resolution electron beam lithography for the fabrication of high-density dielectric metamaterials

  • 1. School of Electronics and Computer Science, University of Southampton, SO17 1BJ (United Kingdom)
  • 2. Innos Ltd, Gower Building, Highfield, Southampton (United Kingdom)

Description

Electron beam lithography has been applied to the fabrication of nanoscale two-dimensional chiral structures with various designs. A fabrication process for planar chiral structures in a thin silicon nitride layer using electron beam lithography and dry etching is presented. A top conductive coating is applied during electron-beam exposure to prevent the occurrence of charging effects caused by the non-conductive silica substrate. Different doses are chosen during the lithography process depending on the complexities and densities of different chiral designs. A very well defined transmission diffraction pattern from arrays of Peano-Gosper fractals is obtained. The optical activity of these dielectric metamaterials shows great potential in their applications of optoelectronic devices and communications

Additional details

Identifiers

DOI
10.1016/j.tsf.2006.09.011;
PII
S0040-6090(06)01060-1;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
515
Journal Issue
7-8
Journal Page Range
p. 3714-3717
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.