High performance InAs/GaAsSb superlattice long wavelength infrared photo-detectors grown on InAs substrates
- 1. Key laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yutian Road, Shanghai 200083 (China)
Description
We demonstrated high performance long wavelength InAs/GaAs0.09Sb0.91 type-II superlattices infrared photo-detectors grown on InAs substrates. Superlattices photodiodes with InAs layer thickness from 14 to 24 ML showed 50% cutoff wavelength from 6 to 12.5 μ m while the lattice-mismatch was kept smaller than 4.0 × 10−4 without any additional interface layers for strain balance. Quantum efficiency spectra showed oscillating characteristics which were attributed to the plasma effect in the highly doped InAs buffer layers. The absorption coefficient of 1800 cm−1 and diffusion length of 10 μ m of minority carriers in the SLs on InAs have been obtained through simulation. A photodiode exhibited a 12.5 μ m cutoff wavelength with a peak detectivity of 7.4 × 1010 cm Hz1/2 W−1 and 2.6 × 1011 cm Hz1/2 W−1 at 76 K and 52 K, respectively. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6641/aa6377Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductor Science and Technology
- Journal Volume
- 32
- Journal Issue
- 5
- Journal Page Range
- [6 p.]
- ISSN
- 0268-1242
- CODEN
- SSTEET
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49087546
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABSORPTION; BALANCES; BUFFERS; CRYSTAL DEFECTS; DIFFUSION LENGTH; DOPED MATERIALS; GALLIUM ARSENIDES; INDIUM ARSENIDES; INFRARED SPECTRA; LAYERS; PHOTODETECTORS; PHOTODIODES; QUANTUM EFFICIENCY; SUBSTRATES; SUPERLATTICES; TEMPERATURE RANGE 0013-0065 K; TEMPERATURE RANGE 0065-0273 K; THICKNESS; WAVELENGTHS
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; CRYSTAL STRUCTURE; DIMENSIONS; EFFICIENCY; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; LENGTH; MATERIALS; MEASURING INSTRUMENTS; PNICTIDES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SORPTION; SPECTRA; TEMPERATURE RANGE; WEIGHT INDICATORS