Published November 1, 2011
| Version v1
Journal article
Design of 700 V triple RESURF nLDMOS with low on-resistance
Creators
- 1. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054 (China)
Description
A 700 V triple RESURF nLDMOS with a low specific on-resistance of 100 mΩ·cm2 is designed. Compared with a conventional double RESURF nLDMOS whose P-type layer is located on the surface of the drift region, the P-type layer of a triple RESURF nLDMOS is located within it. The difference between the locations of the P-type layer means that a triple RESURF nLDMOS has about a 30% lower specific on-resistance at the same given breakdown voltage of 700 V Detailed research of the influences of various parameters on breakdown voltage, specific on-resistance, as well as process tolerance is involved. The results may provide guiding principles for the design of triple RESURF nLDMOS. (semiconductor devices)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-4926/32/11/114002Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Semiconductors
- Journal Volume
- 32
- Journal Issue
- 11
- Journal Page Range
- [4 p.]
- ISSN
- 1674-4926
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43103713
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BREAKDOWN; DESIGN; ELECTRIC POTENTIAL; LAYERS; SEMICONDUCTOR DEVICES; SURFACES