Published November 1, 2011 | Version v1
Journal article

Design of 700 V triple RESURF nLDMOS with low on-resistance

  • 1. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054 (China)

Description

A 700 V triple RESURF nLDMOS with a low specific on-resistance of 100 mΩ·cm2 is designed. Compared with a conventional double RESURF nLDMOS whose P-type layer is located on the surface of the drift region, the P-type layer of a triple RESURF nLDMOS is located within it. The difference between the locations of the P-type layer means that a triple RESURF nLDMOS has about a 30% lower specific on-resistance at the same given breakdown voltage of 700 V Detailed research of the influences of various parameters on breakdown voltage, specific on-resistance, as well as process tolerance is involved. The results may provide guiding principles for the design of triple RESURF nLDMOS. (semiconductor devices)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/32/11/114002

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
32
Journal Issue
11
Journal Page Range
[4 p.]
ISSN
1674-4926

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43103713
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
BREAKDOWN; DESIGN; ELECTRIC POTENTIAL; LAYERS; SEMICONDUCTOR DEVICES; SURFACES