Published September 2005 | Version v1
Miscellaneous

Temperature and frequency dependence of conductivity of GaAs layers compensated by bombardment with H+ ions

  • 1. Lyublinskij tekhnicheskij univ., Lyublin (Poland)
  • 2. Belaruski dzyarzhawny univ., Minsk (Belarus)

Description

The paper discusses testing of GaAs layers bombarded with H+ ions to show advantages of the application of alternating-current measurements to kinetic phenomena related with high-temperature jumping recharging in semiconductors. (authors)

Part of:
Proceedings of the 6. international conference 'Interaction of radiation with solids'

Additional details

Additional titles

Original title (Russian)
Температурная и частотная зависимость проводимости слоев GaAs, компенсированных облучением ионами X

Publishing Information

Imprint Place
Minsk (Belarus)
Imprint Title
Proceedings of the 6. international conference 'Interaction of radiation with solids'
Imprint Pagination
[442 p.]
Journal Page Range
p. 89-91
Report number
INIS-BY--069

Conference

Title
6. international conference 'Interaction of radiation with solids'
Original Conference Title
6. mezhdunarodnaya konferentsiya 'Vzaimodejstvie izluchenij s tverdym telom'
Dates
28-30 Sep 2005
Place
Minsk (Belarus)

Optional Information

Notes
4 refs., 5 figs. Imprint:Materialy 6. mezhdunarodnoj konferentsii 'Vzaimodejstvie izluchenij s tverdym telom'