Crystallite growth in nanocrystalline tungsten; rate determining mechanism and the role of contaminations
- 1. Max Planck Institute for Intelligent Systems, Heisenbergstr. 3, D-70569 Stuttgart (Germany)
- 2. Institute for Materials Science, University of Stuttgart (Germany)
Description
The thermal stability of nanocrystalline tungsten was investigated by tracing the evolution of the microstructure as a function of (isothermal) annealing time at different temperatures (800−875 °C). To this end especially in situ X-ray diffraction and transmission electron microscopy methods were applied to ball milled tungsten powder. Initially the dislocation density and the crystallite/domain size decreased and increased rapidly, respectively. Upon prolonged annealing the crystallite growth rate decelerated and even became nil: a saturation crystallite size, increasing with increasing annealing temperature, was attained. Application of all available isothermal growth models to the experimental data resulted in very low values for the activation energy (60−120 kJ/mol) indicating that recovery of the deformed microstructure is the dominantly occurring process, leading to pronounced crystallite/domain growth. The effect on the growth kinetics of different levels of contaminations, which exert a drag force on the moving boundaries, was also investigated.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2015.12.012Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2015.12.012;
- PII
- S1359-6454(15)30123-3;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 105
- Journal Page Range
- p. 232-243
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47125554
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACTIVATION ENERGY; ANNEALING; CRYSTAL GROWTH; CRYSTALS; DISLOCATIONS; DOMAIN STRUCTURE; MICROSTRUCTURE; NANOMATERIALS; NANOSTRUCTURES; POWDERS; TEMPERATURE DEPENDENCE; TIME DEPENDENCE; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; ENERGY; HEAT TREATMENTS; LINE DEFECTS; MATERIALS; METALS; MICROSCOPY; REFRACTORY METALS; SCATTERING; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.