Published July 1996 | Version v1
Journal article Metadata-only

Allowance for apparatus distortions in modeling the structure of Langmuir-Blodgett films from reflectivity data

Creators

  • 1. Moscow State University, Moscow, 119899 (Russian Federation)
  • 2. Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii pr. 59, Moscow, 117333 (Russian Federation)

Description

The methods of allowing for various apparatus factors giving rise to distortions of an ideal x-ray or neutron reflectivity curves in modeling the structure of Langmuir-Blodgett films are considered

Additional details

Identifiers

URL
https://www.pleiades.online/contents/cryst/cryst4_96v41cont.htm;

Publishing Information

Journal Title
Crystallography Reports
Journal Volume
41
Journal Issue
4
Journal Page Range
p. 592-597
ISSN
1063-7745
CODEN
CYSTE3

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35073683
Subject category
S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Translation
Descriptors DEI
DIAGRAMS; FILMS; NEUTRONS; REFLECTIVITY; SIMULATION; SURFACES; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
Descriptors DEC
BARYONS; COHERENT SCATTERING; DIFFRACTION; ELEMENTARY PARTICLES; FERMIONS; HADRONS; INFORMATION; NUCLEONS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SCATTERING; SPECTROSCOPY; SURFACE PROPERTIES

Optional Information

Notes
Translated from Kristallografiya, ISSN 0023-4761, 41, 629-634 (July-August 1996); (c) 1996 MAIK/Interperiodika