Published April 2011 | Version v1
Journal article

Magnetic field imaging with nitrogen-vacancy ensembles

  • 1. School of Engineering and Applied Sciences, Harvard University, Cambridge, MA 02138 (United States)
  • 2. Harvard-Smithsonian Center for Astrophysics, Cambridge, MA 02138 (United States)
  • 3. Physics Department, Harvard University, Cambridge, MA 02138 (United States)
  • 4. Nuclear Science and Engineering Department, Massachusetts Institute of Technology, Cambridge, MA 02139 (United States)
  • 5. Electrical and Computer Engineering Department, Texas AM University, College Station, TX 77843 (United States)

Description

We demonstrate a method of imaging spatially varying magnetic fields using a thin layer of nitrogen-vacancy (NV) centers at the surface of a diamond chip. Fluorescence emitted by the two-dimensional NV ensemble is detected by a CCD array, from which a vector magnetic field pattern is reconstructed. As a demonstration, ac current is passed through wires placed on the diamond chip surface, and the resulting ac magnetic field patterns are imaged using an echo-based technique with sub-micron resolution over a 140 μmx140 μm field of view, giving single-pixel sensitivity ∼100 nT/√(Hz). We discuss ongoing efforts to further improve the sensitivity, as well as potential bioimaging applications such as real-time imaging of activity in functional, cultured networks of neurons.

Availability note (English)

Available from http://dx.doi.org/10.1088/1367-2630/13/4/045021

Additional details

Publishing Information

Journal Title
New Journal of Physics
Journal Volume
13
Journal Issue
4
Journal Page Range
[13 p.]
ISSN
1367-2630

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43026867
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
CHARGE-COUPLED DEVICES; DIAMONDS; FLUORESCENCE; MAGNETIC FIELDS; NITROGEN; SENSITIVITY; THIN FILMS; VACANCIES
Descriptors DEC
CARBON; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; EMISSION; FILMS; LUMINESCENCE; MINERALS; NONMETALS; PHOTON EMISSION; POINT DEFECTS; SEMICONDUCTOR DEVICES