Magnetic field imaging with nitrogen-vacancy ensembles
Creators
- 1. School of Engineering and Applied Sciences, Harvard University, Cambridge, MA 02138 (United States)
- 2. Harvard-Smithsonian Center for Astrophysics, Cambridge, MA 02138 (United States)
- 3. Physics Department, Harvard University, Cambridge, MA 02138 (United States)
- 4. Nuclear Science and Engineering Department, Massachusetts Institute of Technology, Cambridge, MA 02139 (United States)
- 5. Electrical and Computer Engineering Department, Texas AM University, College Station, TX 77843 (United States)
Description
We demonstrate a method of imaging spatially varying magnetic fields using a thin layer of nitrogen-vacancy (NV) centers at the surface of a diamond chip. Fluorescence emitted by the two-dimensional NV ensemble is detected by a CCD array, from which a vector magnetic field pattern is reconstructed. As a demonstration, ac current is passed through wires placed on the diamond chip surface, and the resulting ac magnetic field patterns are imaged using an echo-based technique with sub-micron resolution over a 140 μmx140 μm field of view, giving single-pixel sensitivity ∼100 nT/√(Hz). We discuss ongoing efforts to further improve the sensitivity, as well as potential bioimaging applications such as real-time imaging of activity in functional, cultured networks of neurons.
Availability note (English)
Available from http://dx.doi.org/10.1088/1367-2630/13/4/045021Additional details
Identifiers
Publishing Information
- Journal Title
- New Journal of Physics
- Journal Volume
- 13
- Journal Issue
- 4
- Journal Page Range
- [13 p.]
- ISSN
- 1367-2630
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43026867
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- CHARGE-COUPLED DEVICES; DIAMONDS; FLUORESCENCE; MAGNETIC FIELDS; NITROGEN; SENSITIVITY; THIN FILMS; VACANCIES
- Descriptors DEC
- CARBON; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; EMISSION; FILMS; LUMINESCENCE; MINERALS; NONMETALS; PHOTON EMISSION; POINT DEFECTS; SEMICONDUCTOR DEVICES