Microstructure of YBa2Cu3O7-δ films on deliberately miscut sapphire buffered with CeO2
Creators
- 1. Department of Physics, Beijing Normal University, Beijing 100875 (China)
- 2. Energy Technology Research Institute, AIST, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568 (Japan)
Description
Microcrack-free thick YBa2Cu3O7-δ (YBCO) films (up to 1000 nm) were successfully fabricated by pulsed laser deposition on deliberately miscut Al2O3(11-bar 02) (5.22 deg. off towards [112-bar 0]) buffered with CeO2. The microstructure of the YBCO films was investigated by cross-section transmission electron microscopy (TEM). No apparent interface reaction is seen for all the TEM observations. A high density of linear defects (dislocations) aligned near c-axis are frequently observed. All the defects are initiated from the YBCO/CeO2 interface, indicating the importance of the microstructure of the CeO2 buffer layer and the sapphire substrate for the growth of YBCO. In addition, numerous small stacking faults lying in the a-b-plane were produced by the linear defects
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physc.2007.04.028Additional details
Identifiers
- DOI
- 10.1016/j.physc.2007.04.028;
- PII
- S0921-4534(07)00510-2;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 460-462
- Journal Page Range
- p. 1384-1385
- ISSN
- 0921-4534
- CODEN
- PHYCE6
Conference
- Title
- 8. international conference on materials and mechanisms of superconductivity and high temperature superconductors
- Acronym
- M2S-HTSC VIII
- Dates
- 9-14 Jul 2006
- Place
- Dresden (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39073388
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM OXIDES; BUFFERS; CERIUM OXIDES; CROSS SECTIONS; CRYSTAL DEFECTS; CRYSTAL GROWTH; DENSITY; DISLOCATIONS; ENERGY BEAM DEPOSITION; HIGH-TC SUPERCONDUCTORS; INTERFACES; LASER RADIATION; MICROSTRUCTURE; PULSED IRRADIATION; SAPPHIRE; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CERIUM COMPOUNDS; CHALCOGENIDES; CORUNDUM; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DEPOSITION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FILMS; IRRADIATION; LINE DEFECTS; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; RARE EARTH COMPOUNDS; SUPERCONDUCTORS; SURFACE COATING; TRANSITION ELEMENT COMPOUNDS; TYPE-II SUPERCONDUCTORS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.