Published July 2008
| Version v1
Journal article
Electronic structure of BiSeI clusters
Creators
- 1. Department of Physics, Vilnius Pedagogical University, Studentu 39, LT-08106 Vilnius (Lithuania)
- 2. Vilnius University, Institute of Theoretical Physics and Astronomy, A. Gostauto 12, LT-01108 Vilnius (Lithuania)
Description
The valence band (VB) energy levels of BiSeI crystals have been calculated and compared to the X-ray photoelectron spectra of SbSI crystals. A molecular cluster consisting of 20 molecules of BiSeI has been used to calculate the total VB density of states by the density functional theory (DFT) method. The spectrum of total VB density of states of the (BiSeI)20 cluster weighted by atomic photoemission cross-sections has been compared with the experimental X-ray photoelectron VB spectrum of SbSI type crystals. The cluster model calculation has showed that the core level energy splitting depends on the difference of ionic charges of the same atoms at the edges of the (BiSeI)20 cluster
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2008.04.003Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2008.04.003;
- PII
- S0368-2048(08)00024-8;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 164
- Journal Issue
- 1-3
- Journal Page Range
- p. 19-23
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40046358
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- CLUSTER MODEL; CROSS SECTIONS; CRYSTALS; DENSITY; DENSITY FUNCTIONAL METHOD; ELECTRONIC STRUCTURE; ENERGY LEVELS; MOLECULAR CLUSTERS; PHOTOEMISSION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CALCULATION METHODS; ELECTRON SPECTROSCOPY; EMISSION; MATHEMATICAL MODELS; NUCLEAR MODELS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SECONDARY EMISSION; SPECTROSCOPY; VARIATIONAL METHODS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.