Pressure dependence of the thermal contact resistance at the Si/He interface
Creators
- 1. Laboratoire d'Informatique pour la Mécanique et les Sciences de l'Ingénieur, UPR CNRS 3251 Université Paris-Sud, B.P. 133, F-91403 Orsay (France)
- 2. Laboratoire d'Energétique Moléculaire et Macroscopique, Combustion, UPR CNRS 288, Ecole Centrale Paris, Grande Voie des Vignes F-92295 Chatenay-Malabry (France)
Description
For bulk solid-solid interfaces, the thermal contact resistance TCR) is generally attributed to a mismatch in the acoustic impedances (density x sound velocity) of each medium [1]. Here, we present a novel study of the TCR for a bulk Silicon crystal (111) in contact with superfluid helium, as a function of the acoustic impedance of the superfluid. The cell design and experimental technique are discussed in [2]. The acoustic impedance is varied by monitoring the pressure of the superfluid. Measurements are carried-out at T∼1.8 K, from a few torrs (vapor pressure) up to 25 bars, corresponding to approximately an 80% change in the acoustic impedance of the superfluid. The experiments show no change in TCR over the entire pressure range, indicating a negligible contribution due to the acoustic impedances. A comparison to the diffuse mismatch model [1] is discussed.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/395/1/012110Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 395
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 6. european thermal sciences conference
- Acronym
- Euratherm 2012
- Dates
- 4-7 Sep 2012
- Place
- Poitiers (France)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44033057
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPARATIVE EVALUATIONS; CRYSTAL STRUCTURE; CRYSTALS; DENSITY; ELECTRIC CONDUCTIVITY; HELIUM; IMPEDANCE; INTERFACES; PRESSURE DEPENDENCE; SILICON; SOLIDS; SOUND WAVES; SUPERFLUIDITY; TEMPERATURE DEPENDENCE; VAPOR PRESSURE
- Descriptors DEC
- ELECTRICAL PROPERTIES; ELEMENTS; EVALUATION; FLUIDS; GASES; NONMETALS; PHYSICAL PROPERTIES; RARE GASES; SEMIMETALS; THERMODYNAMIC PROPERTIES