Published November 26, 2012 | Version v1
Journal article

Pressure dependence of the thermal contact resistance at the Si/He interface

  • 1. Laboratoire d'Informatique pour la Mécanique et les Sciences de l'Ingénieur, UPR CNRS 3251 Université Paris-Sud, B.P. 133, F-91403 Orsay (France)
  • 2. Laboratoire d'Energétique Moléculaire et Macroscopique, Combustion, UPR CNRS 288, Ecole Centrale Paris, Grande Voie des Vignes F-92295 Chatenay-Malabry (France)

Description

For bulk solid-solid interfaces, the thermal contact resistance TCR) is generally attributed to a mismatch in the acoustic impedances (density x sound velocity) of each medium [1]. Here, we present a novel study of the TCR for a bulk Silicon crystal (111) in contact with superfluid helium, as a function of the acoustic impedance of the superfluid. The cell design and experimental technique are discussed in [2]. The acoustic impedance is varied by monitoring the pressure of the superfluid. Measurements are carried-out at T∼1.8 K, from a few torrs (vapor pressure) up to 25 bars, corresponding to approximately an 80% change in the acoustic impedance of the superfluid. The experiments show no change in TCR over the entire pressure range, indicating a negligible contribution due to the acoustic impedances. A comparison to the diffuse mismatch model [1] is discussed.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/395/1/012110

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
395
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
6. european thermal sciences conference
Acronym
Euratherm 2012
Dates
4-7 Sep 2012
Place
Poitiers (France)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44033057
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPARATIVE EVALUATIONS; CRYSTAL STRUCTURE; CRYSTALS; DENSITY; ELECTRIC CONDUCTIVITY; HELIUM; IMPEDANCE; INTERFACES; PRESSURE DEPENDENCE; SILICON; SOLIDS; SOUND WAVES; SUPERFLUIDITY; TEMPERATURE DEPENDENCE; VAPOR PRESSURE
Descriptors DEC
ELECTRICAL PROPERTIES; ELEMENTS; EVALUATION; FLUIDS; GASES; NONMETALS; PHYSICAL PROPERTIES; RARE GASES; SEMIMETALS; THERMODYNAMIC PROPERTIES