Published March 2018 | Version v1
Journal article

A phase field method for modeling anodic dissolution induced stress corrosion crack propagation

  • 1. Université de Lyon, CNRS, INSA-Lyon, LaMCoS UMR5259 (France)
  • 2. Université de Lyon, CNRS, INSA-Lyon, Université Lyon 1, MateIS UMR5510 (France)
  • 3. Synchrotron Soleil, Psyche beamline, L'Orme des Merisiers, 91190 Saint Aubin (France)

Description

Highlights: • New phase field model for stress corrosion cracking. • Effects of both electrochemical and mechanical processes are considered. • Efficient finite element implementation. • Numerical results are compared to experimental data obtained by in situ microtomography. - Abstract: The phase field method is a powerful tool for studying microstructural evolution in various domains of material sciences, including phase change, initiation and propagation of fracture. In this work, a new formulation is developed based on the phase field method for modeling stress corrosion cracking (SCC) induced by anodic dissolution. This method was applied for modeling SCC of an aluminum alloy (2xxx series) in a saline medium (NaCl), which allows considering the effects of both electrochemical and mechanical processes. The classical phase transition model for material dissolution is coupled with the mechanical problem in a robust manner, providing an efficient tool for studying the competition between electrochemical and mechanical contributions to fracture. A numerical implementation based on finite elements is elaborated. The numerical results are compared to experimental data obtained by in situ microtomography.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.corsci.2017.12.027

Additional details

Identifiers

DOI
10.1016/j.corsci.2017.12.027;
PII
S0010938X17305875;

Publishing Information

Journal Title
Corrosion Science
Journal Volume
132
Journal Page Range
p. 146-160
ISSN
0010-938X
CODEN
CRRSAA

Optional Information

Copyright
Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.