Published June 2010
| Version v1
Journal article
Attenuation of excited electrons at crystal surfaces
Creators
- 1. Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnicka 10, 162 53 Prague 6 (Czech Republic)
- 2. IKERBASQUE, Basque Foundation for Science, 48011 Bilbao (Spain)
- 3. Donostia International Physics Center (DIPC), 20018 San Sebastian, Basque Country (Spain)
- 4. Departamento de Fisica de Materiales, Facultad de Ciencias Quimicas, Universidad del Pais Vasco, 20080 San Sebastian, Basque Country (Spain)
Description
Attenuation of the electron current determines surface sensitivity of electron spectroscopies. Pronounced energy and directional dependencies of the electron attenuation in crystals differ strongly from those commonly used for amorphous solids. Quantum descriptions of the electron attenuation can be obtained from the complex band structure of crystal surfaces at energies above the vacuum level. Contributions, specific for concrete processes, are obtained from theoretical description of photoelectron spectroscopy and of electron diffraction.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2010.04.008Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2010.04.008;
- PII
- S0368-2048(10)00086-1;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 180
- Journal Issue
- 1-3
- Journal Page Range
- p. 66-68
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42013225
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANISOTROPY; ATTENUATION; CRYSTALS; ELECTRIC CURRENTS; ELECTRON DIFFRACTION; ELECTRONS; PHOTOELECTRON SPECTROSCOPY; SENSITIVITY; SURFACES
- Descriptors DEC
- COHERENT SCATTERING; CURRENTS; DIFFRACTION; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; SCATTERING; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.