Published December 15, 2011
| Version v1
Journal article
Heavy-ion microbeam system for cell irradiation at Kyoto University
- 1. School of Medicine, Wakayama Medical University, Mikazura, Wakayama 641-0011 (Japan)
- 2. Department of Physics, Graduate School of Science, Kyoto 606-8502 (Japan)
- 3. Radioisotope Research Center, Kyoto University, Kyoto 606-8501 (Japan)
Description
We have developed a heavy-ion microbeam system for cell irradiation that uses an 8-MV tandem Van de Graaff accelerator at Kyoto University. Using a pair of apertures as the final collimator, microbeams of carbon, fluorine, and silicon were extracted to the atmosphere with few background particles. We used a thin transmission scintillator and a photomultiplier detector to accurately measure the number of extracted particles. To examine beam spreading, the beam profile was measured by observing tracks of an irradiated CR-39 track detector. The two disks with holes which were added to the collimating apertures reduced background radiation due to secondary X-rays and electrons from the apertures.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2011.04.101Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2011.04.101;
- PII
- S0168-583X(11)00452-6;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 269
- Journal Issue
- 24
- Journal Page Range
- p. 3153-3157
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 10. European conference on accelerators in applied research and technology
- Acronym
- ECAART10
- Dates
- 13-17 Sep 2010
- Place
- Athens (Greece)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43106216
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- APERTURES; BACKGROUND RADIATION; BEAM PROFILES; CARBON; COLLIMATORS; DIELECTRIC TRACK DETECTORS; ELECTRONS; FLUORINE; HEAVY IONS; ION BEAMS; PARTICLE TRACKS; PHOTOMULTIPLIERS; SCINTILLATION COUNTING; SILICON; VAN DE GRAAFF ACCELERATORS; X RADIATION
- Descriptors DEC
- ACCELERATORS; BEAMS; CHARGED PARTICLES; COUNTING TECHNIQUES; ELECTROMAGNETIC RADIATION; ELECTROSTATIC ACCELERATORS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; HALOGENS; IONIZING RADIATIONS; IONS; LEPTONS; MEASURING INSTRUMENTS; NONMETALS; OPENINGS; PHOTOTUBES; RADIATION DETECTORS; RADIATIONS; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.