Published October 1990
| Version v1
Report
Homogeneity and reliability of reference materials from the aspect of XRF and PIXE analyst
Description
Reference materials supplied by the IAEA Analytical Quality Control are of great help to XRF and PIXE multielement analysis, but homogeneity and particle size of the samples have to be taken into consideration, especially for elements with low Z or with concentration close to the detection limit. 5 refs, 2 figs, 2 tabs
Additional details
Publishing Information
- Imprint Title
- International Atomic Energy Agency consultants' meeting on Analytical Quality Control Services, Vienna, 17-19 September 1990
- Imprint Pagination
- 96 p.
- Journal Page Range
- p. 25-30.
- Report number
- IAEA-AL--039
Conference
- Title
- IAEA consultants' meeting on Analytical Quality Control Services.
- Dates
- 17-19 Sep 1990.
- Place
- Vienna (Austria).
INIS
- Country of Publication
- International Atomic Energy Agency (IAEA)
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 22068365
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CALIBRATION STANDARDS; HOMOGENEOUS MIXTURES; MULTI-ELEMENT ANALYSIS; PARTICLE SIZE; PIXE ANALYSIS; QUALITY CONTROL; RELIABILITY; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; CONTROL; DISPERSIONS; MIXTURES; NONDESTRUCTIVE ANALYSIS; SIZE; X-RAY EMISSION ANALYSIS