Published August 31, 2013 | Version v1
Journal article

Optical investigations of the effect of solvent and thermal annealing on the optoelectronic properties of Poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) films

Description

Poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS) is one of the most promising conducting polymers that can be used as transparent electrode or as buffer layer for organic electronic devices. However, when used as an electrode, its conductivity has to be optimized either by the addition of solvents or by post-deposition processing. In this work, we investigate the effect of the addition of the polar solvent dimethylsulfoxide (DMSO) to an aqueous PEDOT:PSS solution on its optical and electrical properties by the implementation of the Drude model for the analysis of the measured pseudo-dielectric function by Spectroscopic Ellipsometry from the near infrared to the visible–far ultraviolet spectral range. The results show that the addition of DMSO increases significantly the film conductivity, which reaches a maximum value at an optimum DMSO concentration as it has confirmed by experimentally measured conductivity values. The post-deposition thermal annealing has been found to have a smaller effect on the film conductivity. - Highlights: • Optical study of Poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS) • The Drude model provides information for PEDOT:PSS conductivity. • The addition of dimethylsulfoxide increases the electrical conductivity of PEDOT:PSS. • The increase in conductivity is correlated to increase of PEDOT grain size. • The thermal treatment has a smaller effect on PEDOT:PSS properties

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2013.03.138

Additional details

Identifiers

DOI
10.1016/j.tsf.2013.03.138;
PII
S0040-6090(13)00647-0;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
541
Journal Page Range
p. 102-106
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
Current trends in optical and X-ray metrology of advanced materials for nanoscale devices III
Acronym
E-MRS spring meeting, symposium W
Dates
14-18 May 2012
Place
Strasbourg (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46090183
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANNEALING; DEPOSITION; DMSO; ELECTRIC CONDUCTIVITY; ELLIPSOMETRY; FILMS; GRAIN SIZE; POLYMERS; SOLAR CELLS; SOLUTIONS; SOLVENTS
Descriptors DEC
DIRECT ENERGY CONVERTERS; DISPERSIONS; ELECTRICAL PROPERTIES; EQUIPMENT; HEAT TREATMENTS; HOMOGENEOUS MIXTURES; MEASURING METHODS; MICROSTRUCTURE; MIXTURES; ORGANIC COMPOUNDS; ORGANIC SULFUR COMPOUNDS; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; PHYSICAL PROPERTIES; SIZE; SOLAR EQUIPMENT; SULFOXIDES

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.