Dielectric relaxation study of gamma irradiated oriented low-density polyethylene

The influence of drawing, gamma irradiation and accelerated aging on the dielectric relaxation of low-density polyethylene has been studied using dielectric loss tangent measurements in the temperature range from 25 to 325 K and in the frequency range from 103 to 106 Hz. The intensity, position and activation energy of the γ- and β-dielectric relaxations were found to be strongly dependent upon the changes in the microstructure of the amorphous phase induced by uniaxial orientation, oxidation and crosslinking