Published January 15, 2011 | Version v1
Journal article

Effects of Li ion implantation energies on the structure, photoluminescence, and ferromagnetism properties of (Li, Co) co-implanted ZnO films

  • 1. Department of Physics and Development Center for New Materials Engineering and Technology in Universities of Guangdong, Zhanjiang Normal University, Zhanjiang 524048 (China)
  • 2. Accelerator Laboratory, Department of Physics, Wuhan University, Wuhan 430072 (China)

Description

Room temperature ferromagnetism was observed in (Li, Co) co-implanted ZnO films. The implantation energy for Co ions was 400 keV, while for Li ions were 50, 100 and 200 keV, respectively. The ion implantation induced defects and disorder has been observed by the XRD, PL and TEM experiments. For the co-implanted ZnO films with Li ion implantation energies of 100 and 200 keV, the band energy emission disappears and the defect related emission with wavelength of 500-700 nm dominates, which can be attributed to defects introduced by implantation. Co-implanted ZnO Films with Li ion implantation energies of 200 keV show a saturation magnetization value (MS) of over 9 x 10-5 emu and a positive coercive field of 60 Oe. The carrier concentration is not much improved after annealing and in the order of 1016 cm-3, which suggests that FM does not depend upon the presence of a significant carrier concentration. The origin of ferromagnetism behavior can be explained on the basis of electrons and defects that form bound magnetic polarons, which overlap to create a spin-split impurity band.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2010.11.035

Additional details

Identifiers

DOI
10.1016/j.nimb.2010.11.035;
PII
S0168-583X(10)00860-8;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
269
Journal Issue
2
Journal Page Range
p. 122-125
ISSN
0168-583X
CODEN
NIMBEU

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.