Published February 2016 | Version v1
Journal article

Application of photon Doppler velocimetry to direct impact Hopkinson pressure bars

  • 1. SMF Fracture and Shock Physics Group, Cavendish Laboratory, JJ Thomson Avenue, Cambridge CB3 0HE (United Kingdom)

Description

Direct impact Hopkinson pressure bar systems offer many potential advantages over split Hopkinson pressure bars, including access to higher strain rates, higher strains for equivalent striker velocity and system length, lower dispersion, and faster achievement of force equilibrium. Currently, these advantages are gained at the expense of all information about the striker impacted specimen face, preventing the experimental determination of force equilibrium, and requiring approximations to be made on the sample deformation history. In this paper, we discuss an experimental method and complementary data analysis for using photon Doppler velocimetry to measure surface velocities of the striker and output bars in a direct impact bar experiment, allowing similar data to be recorded as in a split bar system. We discuss extracting velocity and force measurements, and the precision of measurements. Results obtained using the technique are compared to equivalent split bar tests, showing improved stress measurements for the lowest and highest strains in fully dense metals, and improvement for all strains in slow and non-equilibrating materials

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
87
Journal Issue
2
Journal Page Range
p. 023101-023101.9
ISSN
0034-6748
CODEN
RSINAK

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47052827
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ACCURACY; DATA ANALYSIS; DEFORMATION; EQUILIBRIUM; LENGTH; METALS; PHOTONS; STRAIN RATE; STRAINS; STRESSES; SURFACES; VELOCITY
Descriptors DEC
BOSONS; DATA PROCESSING; DIMENSIONS; ELEMENTARY PARTICLES; ELEMENTS; MASSLESS PARTICLES; PROCESSING

Optional Information

Notes
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