A microcomputer controlled X-ray diffractometer for investigations in transmission technique

The coupling of the microcomputer system MPS 4944 with an X-ray wide-angle diffractometer is presented. The configuration of the system, algorithms and programs are described. The microcomputer system effects control and surveillance of the goniometer, accumulation and normalization of the scattered intensities. The coupling of a microcomputer to the diffractometer afforded an increase of the precision of measurement, shortening of the time needed for the scattering experiment and improved the handling comfort of the diffractometer. New experimental variants are rendered possible, for instance, structural investigations with program-controlled temperature regulation of the samples. (author)