Published 2017
| Version v1
Journal article
Transverse diffusion in the TPC of the T2K near detector
Creators
- 1. III. Physikalisches Institut B, RWTH Aachen University (Germany)
Description
Transverse diffusion affects the spatial resolution in a Time Projection Chamber (TPC). In the TPCs of the T2K near detector it can be derived from the charge distribution on the Micromegas plane. The electron cloud width is reconstructed from the charge fraction detected by the individual anode pads. This cloud width is investigated in dependence of the drift distance and the transverse diffusion coefficient is extracted.
Additional details
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Muenster 2017 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 52(4)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- 81. Annual meeting of DPG and DPG Spring meeting 2017 of the divisions on hadronic and nuclear physics, radiation and medical physics, particle physics and the working groups on equal opportunities, energy, information, young DPG, physics and disarmament
- Original Conference Title
- 81. Jahrestagung der DPG und DPG-Fruehjahrstagung 2017 der Fachverbaende Physik der Hadronen und Kerne, Strahlen- und Medizinphysik, Teilchenphysik und Arbeitskreise Chancengleichheit, Energie, Industrie und Wirtschaft sowie der Arbeitsgruppen Information, junge DPG, Physik und Abruestung
- Dates
- 27-31 Mar 2017
- Place
- Muenster (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 49060803
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE DENSITY; DIFFUSION; ELECTRON DENSITY; ELECTRON DRIFT; TIME PROJECTION CHAMBERS
- Descriptors DEC
- DRIFT CHAMBERS; MEASURING INSTRUMENTS; MULTIWIRE PROPORTIONAL CHAMBERS; PROPORTIONAL COUNTERS; RADIATION DETECTORS
Optional Information
- Notes
- Session: HK 8.7 Mo 18:30; No further information available