Published July 7, 2009 | Version v1
Journal article

X-Pinch And Its Applications In X-ray Radiograph

  • 1. Department of Electrical Engineering, Tsinghua University, Beijing 100084 (China)

Description

An X-pinch device and the related diagnostics of x-ray emission from X-pinch were briefly described. The time-resolved x-ray measurements with photoconducting diodes show that the x-ray pulse usually consists of two subnanosecond peaks with a time interval of about 0.5 ns. Being consistent with these two peaks of the x-ray pulse, two point x-ray sources of size ranging from 100 μm to 5 μm and depending on cut-off x-ray photon energy were usually observed on the pinhole pictures. The x-pinch was used as x-ray source for backlighting of the electrical explosion of single wire and the evolution of X-pinch, and for phase-contrast imaging of soft biological objects such as a small shrimp and a mosquito.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1150
Journal Issue
1
Journal Page Range
p. 168-173
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
3. international meeting on frontiers in physics
Dates
12-16 Jan 2009
Place
Kuala Lumpur (Malaysia)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41075151
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S07: ISOTOPES AND RADIATION SOURCES;
Resource subtype / Literary indicator
Conference
Descriptors DEI
EXPLODING WIRES; IMAGES; PINCH DEVICES; PINCH EFFECT; PLASMA; PLASMA DIAGNOSTICS; PULSES; TIME RESOLUTION; X-RAY RADIOGRAPHY; X-RAY SOURCES; X-RAY SPECTRA
Descriptors DEC
INDUSTRIAL RADIOGRAPHY; MATERIALS TESTING; NONDESTRUCTIVE TESTING; RADIATION SOURCES; RESOLUTION; SPECTRA; TESTING; THERMONUCLEAR DEVICES; TIMING PROPERTIES; WIRES

Optional Information

Notes
(c) 2009 American Institute of Physics