Published July 7, 2009
| Version v1
Journal article
X-Pinch And Its Applications In X-ray Radiograph
- 1. Department of Electrical Engineering, Tsinghua University, Beijing 100084 (China)
Description
An X-pinch device and the related diagnostics of x-ray emission from X-pinch were briefly described. The time-resolved x-ray measurements with photoconducting diodes show that the x-ray pulse usually consists of two subnanosecond peaks with a time interval of about 0.5 ns. Being consistent with these two peaks of the x-ray pulse, two point x-ray sources of size ranging from 100 μm to 5 μm and depending on cut-off x-ray photon energy were usually observed on the pinhole pictures. The x-pinch was used as x-ray source for backlighting of the electrical explosion of single wire and the evolution of X-pinch, and for phase-contrast imaging of soft biological objects such as a small shrimp and a mosquito.
Additional details
Identifiers
- DOI
- 10.1063/1.3192232;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1150
- Journal Issue
- 1
- Journal Page Range
- p. 168-173
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 3. international meeting on frontiers in physics
- Dates
- 12-16 Jan 2009
- Place
- Kuala Lumpur (Malaysia)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41075151
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S07: ISOTOPES AND RADIATION SOURCES;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- EXPLODING WIRES; IMAGES; PINCH DEVICES; PINCH EFFECT; PLASMA; PLASMA DIAGNOSTICS; PULSES; TIME RESOLUTION; X-RAY RADIOGRAPHY; X-RAY SOURCES; X-RAY SPECTRA
- Descriptors DEC
- INDUSTRIAL RADIOGRAPHY; MATERIALS TESTING; NONDESTRUCTIVE TESTING; RADIATION SOURCES; RESOLUTION; SPECTRA; TESTING; THERMONUCLEAR DEVICES; TIMING PROPERTIES; WIRES
Optional Information
- Notes
- (c) 2009 American Institute of Physics