Role of V on the coercivity of SmFe12-based melt-spun ribbons revealed by machine learning and microstructure characterizations
- 1. International Center for Young Scientists, National Institute for Materials Science, Tsukuba 305-0047 (Japan)
- 2. Elements Strategy Initiative Center for Magnetic Materials, National Institute for Materials Science, Tsukuba 305-0047 (Japan)
- 3. Graduate School of Science and Technology, University of Tsukuba, Tsukuba 305-8571 (Japan)
Description
We employed machine-learning of a dataset extracted from literature on Sm(Fe,X)12-based alloys to understand the most influential parameters for coercivity. V-addition is found to be most influential to coercivity. The microstructure origin for coercivity in SmxFe11Ti and SmxFe10TiV (1.0≤x ≤ 2.1) melt-spun ribbons was investigated experimentally. Unlike V-free alloys, ThMn12-type structure can be stabilized in a wide range of x =1.03-1.62 in SmxFe10TiV ribbons. Coercivity increases from 0.51 T for Sm0.99Fe11Ti to 1.1 T for Sm1.06Fe10TiV optimally-annealed ribbons. The enhanced coercivity originates from formation of a Sm-enriched intergranular phase enveloping the SmFe12-based grains, increasing pinning force against the magnetic domain-wall propagation.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2021.113925Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2021.113925;
- PII
- S1359646221002050;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 200
- Journal Page Range
- vp.
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53120322
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALLOYS; ANNEALING; COERCIVE FORCE; MACHINE LEARNING; MAGNETIC FLUX; MICROSTRUCTURE
- Descriptors DEC
- ALGORITHMS; ARTIFICIAL INTELLIGENCE; HEAT TREATMENTS; LEARNING; MATHEMATICAL LOGIC
Optional Information
- Copyright
- Copyright (c) 2021 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.