Published 1997 | Version v1
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Neutron localization limit, or film thickness measurements by neutron reflection method

Creators

  • 1. Reactor and Neutron Physics Department, National Research Centre, Atomic Energy Authority, Cairo (Egypt)
  • 2. Frank Laboratory of Neutron Physics, Joint Institute for Nuclear Research, Dubna (Russian Federation)

Description

The limit sensitivity of a neutron reflection method for thickness measurements of nonuniform thin layers of matter on the surface of solids is discussed. It is shown that the sensitivity is high and corresponds to the monolayer of a solid (i.e. about 0.5 nm), and is at a modern level of moderate requirements for tools. The concept of neutron localization limit is introduced

Availability note (English)

Available from INIS in electronic form

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Additional details

Publishing Information

Imprint Pagination
6 p.
Report number
JINR-E--18-97-341

INIS

Country of Publication
Joint Institute for Nuclear Research (JINR)
Country of Input or Organization
Joint Institute for Nuclear Research (JINR)
INIS RN
29040346
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
NIOBIUM; PENETRATION DEPTH; QUASIPOTENTIAL EQUATION; REFLECTION; SENSITIVITY; SUPERCONDUCTING FILMS; THERMAL NEUTRONS; THICKNESS
Descriptors DEC
BARYONS; DIMENSIONS; ELEMENTARY PARTICLES; ELEMENTS; EQUATIONS; FERMIONS; FILMS; HADRONS; INTEGRAL EQUATIONS; METALS; NEUTRONS; NUCLEONS; TRANSITION ELEMENTS

Optional Information

Notes
5 refs., 3 figs. Submitted to the conference 'NUPPAC'97', Cairo (EG), 15-19 Nov 1997