Published May 2009
| Version v1
Journal article
Transmission electron microscopy study of an electron-beam-induced phase transformation of niobium nitride
- 1. Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545 (United States)
- 2. Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047 (Japan)
Description
Tetragonal γ-NbN1-x was irradiated with 300 keV electrons at room temperature to fluences from 1.8 x 1024-5.4 x 1026 e/m2. The superlattice structure in γ-NbN1-x was observed using transmission electron microscopy and found to disappear at a fluence of 5.4 x 1026 e/m2. During this process, displaced nitrogen atoms occupy vacant sites on the nitrogen sublattice. The final structure is a δ-phase (B1) structure. A randomized arrangement of N vacancies is responsible for the observed γ → δ transformation
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2009.01.023Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2009.01.023;
- PII
- S1359-6462(09)00051-7;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 60
- Journal Issue
- 9
- Journal Page Range
- p. 799-802
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40077650
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ELECTRON BEAMS; IRRADIATION; KEV RANGE 100-1000; NIOBIUM NITRIDES; NITROGEN; PHASE TRANSFORMATIONS; SUPERLATTICES; TEMPERATURE RANGE 0273-0400 K; TRANSMISSION ELECTRON MICROSCOPY; VACANCIES
- Descriptors DEC
- BEAMS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; KEV RANGE; LEPTON BEAMS; MICROSCOPY; NIOBIUM COMPOUNDS; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; PARTICLE BEAMS; PNICTIDES; POINT DEFECTS; REFRACTORY METAL COMPOUNDS; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.