Published August 15, 2007 | Version v1
Journal article Metadata-only

Optical constants of β-FeSi2 thin film on Si(001) substrate obtained by simultaneous equations from reflectance and transmittance spectra

Creators

  • 1. Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro, Tokyo 152-8552 (Japan)
  • 2. Tokyo University of Science, 1-3 Kagurazaka, Shinjuku, Tokyo 162-8601 (Japan)
  • 3. National Institute of Advanced Industrial Science and Technology, Tsukuba Central 2, Tsukuba 305-8568 (Japan)

Description

β-FeSi2 films were prepared on Si(001) substrates by the molecular beam epitaxy method using an Fe source. The crystallinity and crystallographic orientation of β-FeSi2 films on Si(001) substrates were characterized by using X-ray diffraction. Optical constants and the onset of the absorption edge of β-FeSi2 films on Si(001) substrates were evaluated by solving simultaneous equations of reflectance and transmittance data. The extinction coefficient calculated by the simultaneous equation method showed abrupt absorption onset near the band-edge of β-FeSi2

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2007.02.074

Additional details

Identifiers

DOI
10.1016/j.tsf.2007.02.074;
PII
S0040-6090(07)00182-4;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
515
Journal Issue
22
Journal Page Range
p. 8154-8157
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
Asia-Pacific conference on semiconducting silicides science and technology towards sustainable optoelectronics
Acronym
APAC-SILICIDE 2006
Dates
29-31 Jul 2006
Place
Kyoto (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39069169
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; CRYSTALLOGRAPHY; INFRARED SPECTRA; IRON SILICIDES; MOLECULAR BEAM EPITAXY; THIN FILMS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DIFFRACTION; EPITAXY; FILMS; IRON COMPOUNDS; SCATTERING; SILICIDES; SILICON COMPOUNDS; SORPTION; SPECTRA; TRANSITION ELEMENT COMPOUNDS

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.