Published December 1987
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Measurement of structure factors and determination of crystal thickness by electron diffraction
- 1. Oslo Univ. (Norway). Fysisk Inst.
- 2. Bristol Univ. (UK). H.H. Wills Physics Lab.
Description
The paper is a survey of various methods for the measurement of structure factors and the determination of crystal thickness by electron diffraction
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19037948.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 14 p.
- Report number
- OUP--87-41
INIS
- Country of Publication
- Norway
- Country of Input or Organization
- Norway
- INIS RN
- 19037948
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ACCURACY; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; KIKUCHI LINES; LAUE METHOD; STRUCTURE FACTORS
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DIFFRACTION METHODS; SCATTERING
Optional Information
- Notes
- 30 refs.