Published August 1, 2014
| Version v1
Journal article
Measurement of proton induced γ-ray emission cross sections on Al from 2.5 to 4.1 MeV
- 1. INFN-Florence and Department of Physics and Astronomy, University of Florence, Sesto Fiorentino, Florence I-50019 (Italy)
- 2. Centro de Física Nuclear da Universidade de Lisboa, 1649-003 Lisboa (Portugal)
- 3. IST/ITN, Campus Tecnológico e Nuclear, Universidade Técnica de Lisboa, E.N. 10, 2866-953 Sacavém (Portugal)
Description
Differential cross section for proton induced γ-ray emission from the reaction 27Al(p,p′γ)27Al (Eγ = 844 and 1014 keV) were measured for proton energies from 2.5 to 4.1 MeV, at 90° and 45°, using a 29 μg/cm2 Al target evaporated on a self-supporting thin Ag film. The γ-rays were detected by two HPGe detectors with nominal 50% and 25% relative efficiency, respectively for the detector placed at 90° and at 45°. Absolute γ-ray differential cross sections were obtained with a method not dependent on the absolute values of the collected beam charge; the overall uncertainty was estimated to be better than 8%, at both angles and at all the beam energies
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2014.02.095Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2014.02.095;
- PII
- S0168-583X(14)00352-8;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 332
- Journal Page Range
- p. 355-358
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 21. international conference on ion beam analysis
- Dates
- 23-28 Jun 2013
- Place
- Seattle, WA (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46129004
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM 27 REACTIONS; BEAMS; DIFFERENTIAL CROSS SECTIONS; EFFICIENCY; FILMS; GAMMA DETECTION; GAMMA RADIATION; HIGH-PURITY GE DETECTORS; MEV RANGE 01-10; PROTONS
- Descriptors DEC
- BARYONS; CROSS SECTIONS; DETECTION; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; GE SEMICONDUCTOR DETECTORS; HADRONS; HEAVY ION REACTIONS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MEV RANGE; NUCLEAR REACTIONS; NUCLEONS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.