Published October 2004
| Version v1
Journal article
Photon-assisted multiple-Andreev reflections in high-Jc NbN/AlN/NbN tunnel junctions
Creators
Description
Interplay between microwave field and Andreev current in epitaxial NbN/AlN/NbN tunnel junctions have been investigated. The subharmonic-gap structures (dV/dI dip-structures) were clearly observed for almost all junctions without microwave field, and the voltage positions of dV/dI dips were well explained by Octavio, Tinkham, Blonder and Klapwijk (OTBK) theory based on multiple-Andreev reflection (MAR). In the presence of microwave field, the dV/dI-V curve only in a high-Jc (5 kA/cm2) junction has a rich subgap structure due to photon-assisted MAR. The observed microwave-induced dV/dI structure was qualitatively explained by the OTBK theory with an effective time-dependent voltage model
Additional details
Identifiers
- DOI
- 10.1016/j.physc.2004.02.228;
- PII
- S0921453404009633;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 412-414
- Journal Issue
- 1-2
- Journal Page Range
- p. 1463-1467
- ISSN
- 0921-4534
- CODEN
- PHYCE6
Conference
- Title
- 16. International symposium on superconductivity: Advances in superconductivity XVI. Part I
- Acronym
- ISS 2003
- Dates
- 27-29 Oct 2003
- Place
- Tsukuba (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36062083
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM NITRIDES; CRITICAL CURRENT; CURRENT DENSITY; ELECTRIC POTENTIAL; EPITAXY; NIOBIUM NITRIDES; PHOTONS; REFLECTION; SUPERCONDUCTING JUNCTIONS; TIME DEPENDENCE; TUNNEL EFFECT
- Descriptors DEC
- ALUMINIUM COMPOUNDS; BOSONS; CRYSTAL GROWTH METHODS; CURRENTS; ELECTRIC CURRENTS; ELEMENTARY PARTICLES; MASSLESS PARTICLES; NIOBIUM COMPOUNDS; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; REFRACTORY METAL COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.