Nanocrystals in the glass and centers of localization of free charge carriers in the thick-film resistors
Description
Conduction mechanism of doped silicate glass (DSG) based on existence of nanocrystals in the glass is proposed. These nanocrystals act as localization centers of free charge carriers. Random distribution of the nanocrystal's sizes and distances between them leads to charge transport by variable length hopping. It is shown that dopant atoms generate the narrow impurity subband of 0.03 eV in width. This subband joins close to the glass valence band top or slightly (less than 0.01 eV) separated from the last. What is why the hopping mechanism coexists with thermal activation one and at low temperatures (T<10 K) resistivity of DSG is proportional to exp (aT-n ), 0.25800 K) structure transitions of nanocrystals take place and conductivity of DSG decreases sharply. Beyond of the minimum of conductivity (above 1000 K) energy gap is formed between the impurity subband and the valence band top of glass, so DSG behaves like a typical semiconductor. (author)
Additional details
Additional titles
- Original title (Russian)
- Нанокристаллы в стекле и центры локализации носителей заряда в толстопленочных резисторах
Publishing Information
- Journal Title
- Uzbekiston Fizika Zhurnali
- Journal Volume
- 14
- Journal Issue
- 1
- Journal Page Range
- p. 23-29
- ISSN
- 1025-8817
INIS
- Country of Publication
- Uzbekistan
- Country of Input or Organization
- Uzbekistan
- INIS RN
- 44041796
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CHARGE CARRIERS; CHARGE TRANSPORT; DISTRIBUTION; DOPED MATERIALS; ENERGY GAP; EV RANGE; FILMS; GLASS; IMPURITIES; NANOSTRUCTURES; RANDOMNESS; RESISTORS; SEMICONDUCTOR MATERIALS; SILICATES; TEMPERATURE RANGE 0065-0273 K; TEMPERATURE RANGE 0400-1000 K; VALENCE
- Descriptors DEC
- ELECTRICAL EQUIPMENT; ENERGY RANGE; EQUIPMENT; MATERIALS; OXYGEN COMPOUNDS; SILICON COMPOUNDS; TEMPERATURE RANGE
Optional Information
- Notes
- 17 refs., 7 figs.