Structural and optical properties of Bi1.5ZnNb1.5O7 pyrochlore thin films prepared by chemical method
Creators
- 1. Laboratorio Associado de Sensores e Materiais, Instituto Nacional de Pesquisas Espaciais (INPE), Av. dos Astronautas, 1758, Jd. Da Granja, 12227-010 Sao Jose dos Campos-SP (Brazil)
- 2. Departamento de Quimica, Instituto Tecnologico de Aeronautica (ITA), Pca. Mal. Eduardo Gomes, 50, Vila das Acacias-12228-900 Sao Jose dos Campos-SP (Brazil)
Description
The Bi1.5ZnNb1.5O7 pyrochlore was prepared by the polymeric precursor method. The films were deposited by dip coating on fluorine-doped tin oxide (FTO)-coated glass, fused quartz, and Pt/Ti/SiO2/Si(100) substrates. The films deposited on FTO-coated glass were annealed at temperatures ranging from 400 to 550 deg. C and from 500 to 800 deg. C, for fused quartz and Pt/Ti/SiO2/Si(100) substrates. Atomic force microscopy images revealed the surface morphology of the films as a function of the annealing temperature. X-ray diffraction detected the cubic pyrochlore in films treated above 450 deg. C, and full crystallization occurred at 700 deg. C. The films showed a high [111] orientation independently of the substrate, whereas those deposited on fused quartz showed the highest orientation. The optical band gap, calculated from the transmission measurements, ranged from 3.9 to 3.2 eV as a function of the temperature and the crystallite size
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2005.09.187;
- PII
- S0040-6090(05)01834-1;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 497
- Journal Issue
- 1-2
- Journal Page Range
- p. 72-76
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37112354
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; ATOMIC FORCE MICROSCOPY; BISMUTH COMPOUNDS; CRYSTALLIZATION; DIELECTRIC MATERIALS; DIP COATING; DOPED MATERIALS; FLUORINE; NIOBIUM COMPOUNDS; OPTICAL PROPERTIES; OXIDES; PYROCHLORE; QUARTZ; SILICON OXIDES; TEMPERATURE RANGE 0400-1000 K; TEMPERATURE RANGE 1000-4000 K; THIN FILMS; TIN OXIDES; X-RAY DIFFRACTION; ZINC COMPOUNDS
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELEMENTS; FILMS; HALOGENS; HEAT TREATMENTS; MATERIALS; MICROSCOPY; MINERALS; NONMETALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; SCATTERING; SILICON COMPOUNDS; SURFACE COATING; TEMPERATURE RANGE; TIN COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.