Published March 31, 2011
| Version v1
Journal article
High mobility bottom gate nanocrystalline-Si thin-film transistors
Creators
Description
We developed high mobility bottom gate nanocrystalline (nc)-Si thin-film transistors (TFTs). nc-Si film was deposited using inductively coupled plasma chemical vapor deposition method on SiNx gate insulator. Because of good film crystallinity and low ion damage, we could get high performance TFT characteristics. Our TFT showed field effect mobility of 9.4 cm2 V-1 s-1 for electrons. These results showed that bottom gate nc-Si TFT could be used in applications such as next generation high definition television and organic light-emitting diode display.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2011.01.283Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2011.01.283;
- PII
- S0040-6090(11)00346-4;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 519
- Journal Issue
- 11
- Journal Page Range
- p. 3922-3924
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42069167
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHEMICAL VAPOR DEPOSITION; CRYSTALS; LIGHT EMITTING DIODES; NANOSTRUCTURES; PERFORMANCE; PLASMA; SILICON; THIN FILMS; TRANSISTORS
- Descriptors DEC
- CHEMICAL COATING; DEPOSITION; ELEMENTS; FILMS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMIMETALS; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.