Published March 31, 2011 | Version v1
Journal article

High mobility bottom gate nanocrystalline-Si thin-film transistors

Creators

Description

We developed high mobility bottom gate nanocrystalline (nc)-Si thin-film transistors (TFTs). nc-Si film was deposited using inductively coupled plasma chemical vapor deposition method on SiNx gate insulator. Because of good film crystallinity and low ion damage, we could get high performance TFT characteristics. Our TFT showed field effect mobility of 9.4 cm2 V-1 s-1 for electrons. These results showed that bottom gate nc-Si TFT could be used in applications such as next generation high definition television and organic light-emitting diode display.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2011.01.283

Additional details

Identifiers

DOI
10.1016/j.tsf.2011.01.283;
PII
S0040-6090(11)00346-4;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
519
Journal Issue
11
Journal Page Range
p. 3922-3924
ISSN
0040-6090
CODEN
THSFAP

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42069167
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CHEMICAL VAPOR DEPOSITION; CRYSTALS; LIGHT EMITTING DIODES; NANOSTRUCTURES; PERFORMANCE; PLASMA; SILICON; THIN FILMS; TRANSISTORS
Descriptors DEC
CHEMICAL COATING; DEPOSITION; ELEMENTS; FILMS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMIMETALS; SURFACE COATING

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.