Published September 2002
| Version v1
Journal article
Nanometer-scale characterization and manipulation of ferroelectric films using scanning probe microscopy
Creators
Description
Ferroelectric domain structures in Pb(Ni0.04Zr0.28Ti0.68)O3 and SrBi2Ta2O9 ferroelectric thin films have been non-destructively observed using various scanning probe microscopy (SPM) modes. Using the SPM, it has been shown that it is possible to not only image but also manipulate the local domain structure on a nanometer scale by biasing the SPM tip. In addition, the SPM was applied to measure dC/dV-V spectra on individual ferroelectric grains. The examples illustrate the possibility of using an SPM-based datastorage read/write system
Additional details
Identifiers
- PII
- S0304885302004730;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 249
- Journal Issue
- 3
- Journal Page Range
- p. 466-470
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34011817
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; BISMUTH COMPOUNDS; DOMAIN STRUCTURE; FERROELECTRIC MATERIALS; INTERMETALLIC COMPOUNDS; LEAD COMPOUNDS; MEMORY DEVICES; NICKEL COMPOUNDS; QUATERNARY ALLOY SYSTEMS; STRONTIUM COMPOUNDS; TANTALUM OXIDES; TERNARY ALLOY SYSTEMS; THIN FILMS; TITANIUM COMPOUNDS; ZIRCONIUM COMPOUNDS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; ALLOY SYSTEMS; ALLOYS; CHALCOGENIDES; DIELECTRIC MATERIALS; FILMS; MATERIALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; REFRACTORY METAL COMPOUNDS; TANTALUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.