Published July 15, 1980 | Version v1
Journal article

Incident ion energy dependence of the secondary photon emission of ion bombarded beryllium

  • 1. Chemistry Division, Argonne National Laboratory, Argonne, Illinois 60439

Description

Secondary photon emission due to ion bombardment of Be metal foil by 200--3000 eV Kr+, Ar+, Ne+, O+2, and N+2 was studied and the emission yield from four Be (I) and one Be (II) transitions as a function of incident ion energy was interpreted in terms of relevant excitation processes. A model based on a velocity dependent excitation process, the random linear collision cascade theory of sputtering; and making allowance for nonradiative de-excitation of the excited sputtered atoms and/or ions, accounted for the observed energy dependent emission yields. The results of this model indicate that the secondary photon emission yield, Y/sup ex//sub i/(v/sub m/), of a given emission line, i, can be expressed as Y/sup ex//sub i/ (v/sub m/) α J(μamp/cm2) S(no./ion) exp[-(A/a)/sub i//v/sub m/], where J is the incident ion current density, S the sputtering yield; v/sub m/ is the velocity corresponding to the maximum transferred energy between the incident ion of energy E1, mass M1, and the target atom of mass M2, i.e., v/sub m/=8M1E1/(M1 +M2)2]/sup 1/2/; (A/a)/sub i/ is the effective nonradiative de-excitation parameter for state i. Values for the (A/a)/sub i/ parameters were found to be 1--3 x 107 cm/sec for the Be (I) and Be (II) states; a decrease to 5--7 x 106 cm/sec upon O+2 bombardment was observed for the Be (I) states, while the value for the Be (II) state did not change

Additional details

Publishing Information

Journal Title
J. Chem. Phys.
Journal Volume
73
Journal Issue
2
Series
J. Chem. Phys.
Journal Page Range
664-672
ISSN
0021-9606